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  1. Electrostatic model of the energy-bending within organic semiconductors: experiment and simulation
    Whitcher TJ, Wong WS, Talik AN, Woon KL, Chanlek N, Nakajima H, et al.
    J Phys Condens Matter, 2016 09 14;28(36):365002.
    PMID: 27390863 DOI: 10.1088/0953-8984/28/36/365002
    The interfacial properties between electrodes and the various organic layers that comprise an organic electronic device are of direct relevance in understanding charge injection, extraction and generation. The energy levels and energy-bending of three interfaces; indium tin oxide (ITO)/poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (

    PEDOT: PSS), ITO/poly(N-vinylcarbazole) (PVK) and

    PEDOT: PSS/PVK were measured using ultraviolet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS). By decoupling the vacuum shift and energy-bending, the energy-bending at these interfaces can be simulated using an electrostatic model that takes into account the energetic disorder of the polymers. The model is further extended to include blended mixtures of semiconductors at differing concentrations and it was found that a very good agreement exists between the experiment and theory for all interfaces. This suggests that the electrostatic model can be used to describe energy-bending at the interface between any organic semiconductors. Further investigation into the effect of the Gaussian density of states width on energy-bending is warranted.

  2. Fulltext X-ray Photoelectron Spectroscopy Analysis of Chitosan-Graphene Oxide-Based Composite Thin Films for Potential Optical Sensing Applications
    Daniyal WMEMM, Fen YW, Saleviter S, Chanlek N, Nakajima H, Abdullah J, et al.
    Polymers (Basel), 2021 Feb 02;13(3).
    PMID: 33540931 DOI: 10.3390/polym13030478
    In this study, X-ray photoelectron spectroscopy (XPS) was used to study chitosan-graphene oxide (chitosan-GO) incorporated with 4-(2-pyridylazo)resorcinol (PAR) and cadmium sulfide quantum dot (CdS QD) composite thin films for the potential optical sensing of cobalt ions (Co2+). From the XPS results, it was confirmed that carbon, oxygen, and nitrogen elements existed on the PAR-chitosan-GO thin film, while for CdS QD-chitosan-GO, the existence of carbon, oxygen, cadmium, nitrogen, and sulfur were confirmed. Further deconvolution of each element using the Gaussian-Lorentzian curve fitting program revealed the sub-peak component of each element and hence the corresponding functional group was identified. Next, investigation using surface plasmon resonance (SPR) optical sensor proved that both chitosan-GO-based thin films were able to detect Co2+ as low as 0.01 ppm for both composite thin films, while the PAR had the higher binding affinity. The interaction of the Co2+ with the thin films was characterized again using XPS to confirm the functional group involved during the reaction. The XPS results proved that primary amino in the PAR-chitosan-GO thin film contributed more important role for the reaction with Co2+, as in agreement with the SPR results.
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