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  1. Ahmed S, Mansoor MA, Mazhar M, Söhnel T, Khaledi H, Basirun WJ, et al.
    Dalton Trans, 2014 Jun 14;43(22):8523-9.
    PMID: 24756425 DOI: 10.1039/c4dt00719k
    An octa-nuclear heterobimetallic complex [Y2Cu6Cl0.7(dmae)6(OAc)7.3(OH)4(H2O)2]·3H2O·0.3CH3C6H5 (dmae = dimethylaminoethanoate; OAc = acetato) was synthesized, characterized by melting point analysis, elemental analysis, FT-IR, and single crystal X-ray diffraction analysis and implemented at 600 °C under an oxygen atmosphere for the deposition of Y2CuO4-5CuO composite thin films by aerosol assisted chemical vapor deposition (AACVD). The chemical composition and surface morphology of the deposited thin film have been determined by X-ray diffraction, scanning electron microscopy and energy dispersive X-ray analysis that suggest the formation of impurity-free crystallite mixtures of the Y2CuO4-5CuO composite, with well-defined evenly distributed particles in the size range of 19-24 nm. An optical band gap energy of 1.82 eV was estimated by UV-visible spectrophotometry. PEC studies show that under illumination with a 150 W halogen lamp and at a potential of 0.8 V, a photocurrent density of 9.85 μA cm(-2) was obtained.
  2. Mansoor MA, Ismail A, Yahya R, Arifin Z, Tiekink ER, Weng NS, et al.
    Inorg Chem, 2013 May 20;52(10):5624-6.
    PMID: 23627942 DOI: 10.1021/ic302772b
    Perovskite-structured lead titanate thin films have been grown on FTO-coated glass substrates from a single-source heterometallic molecular complex, [PbTi(μ2-O2CCF3)4(THF)3(μ3-O)]2 (1), which was isolated in quantitative yield from the reaction of tetraacetatolead(IV), tetrabutoxytitanium(IV), and trifluoroacetic acid from a tetrahydrofuran solution. Complex 1 has been characterized by physicochemical methods such as melting point, microanalysis, FTIR, (1)H and (19)F NMR, thermal analysis, and single-crystal X-ray diffraction (XRD) analysis. Thin films of lead titanate having spherical particles of various sizes have been grown from 1 by aerosol-assisted chemical vapor deposition at 550 °C. The thin films have been characterized by powder XRD, scanning electron microscopy, and energy-dispersive X-ray analysis. An optical band gap of 3.69 eV has been estimated by UV-visible spectrophotometry.
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