Affiliations 

  • 1 Department of Electronics and Communication Engineering, B. P. Poddar Institute of Management and Technology, 137, V. I. P Road, Kolkata, West Bengal, 700 052, India
  • 2 Department of Computer Science and Engineering, Maulana Abul Kalam Azad University of Technology, NH-12(Old NH-34), Haringhata, Post Office - Simhat, P.S. - Haringhata, Pin - 741249, Kolkata, West Bengal, 700 064, India
  • 3 Institute of IR 4.0, The National University of Malaysia (UKM), 43600, Bangi, Selangor, Malaysia. ali.ahmadian@ukm.edu.my
  • 4 Department of Chemical and Process Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia (UKM), Bangi, Selangor, Malaysia
  • 5 Institute for Mathematical Research (INSPEM), Universiti Putra Malaysia (UPM), 43400, Serdang, Malaysia
Nanoscale Res Lett, 2021 Jan 29;16(1):20.
PMID: 33512575 DOI: 10.1186/s11671-020-03467-x

Abstract

Doping is the key feature in semiconductor device fabrication. Many strategies have been discovered for controlling doping in the area of semiconductor physics during the past few decades. Electrical doping is a promising strategy that is used for effective tuning of the charge populations, electronic properties, and transmission properties. This doping process reduces the risk of high temperature, contamination of foreign particles. Significant experimental and theoretical efforts are demonstrated to study the characteristics of electrical doping during the past few decades. In this article, we first briefly review the historical roadmap of electrical doping. Secondly, we will discuss electrical doping at the molecular level. Thus, we will review some experimental works at the molecular level along with we review a variety of research works that are performed based on electrical doping. Then we figure out importance of electrical doping and its importance. Furthermore, we describe the methods of electrical doping. Finally, we conclude with a brief comparative study between electrical and conventional doping methods.

* Title and MeSH Headings from MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine.