Affiliations 

  • 1 Department of Computer Engineering, College of Computer Sciences and Information Technology, King Faisal University Saudi Arabia famed@kfu.edu.sa
  • 2 Department of Electronics and Communication Engineering, Indian Institute of Technology Roorkee India
  • 3 Department of Electrical and Electronics Engineering, Universiti Teknologi Petronas Malaysia
  • 4 Department of Nanotechnology and Advanced Materials Engineering, Sejong University Seoul 143-747 Republic of Korea haider@sejong.ac.kr
  • 5 College of Computing and Data Science, Nanyang Technological University 639798 Singapore
Nanoscale Adv, 2024 Sep 09.
PMID: 39263252 DOI: 10.1039/d4na00158c

Abstract

The rapid advancement of new technologies has resulted in a surge of data, while conventional computers are nearing their computational limits. The prevalent von Neumann architecture, where processing and storage units operate independently, faces challenges such as data migration through buses, leading to decreased computing speed and increased energy loss. Ongoing research aims to enhance computing capabilities through the development of innovative chips and the adoption of new system architectures. One noteworthy advancement is Resistive Random Access Memory (RRAM), an emerging memory technology. RRAM can alter its resistance through electrical signals at both ends, retaining its state even after power-down. This technology holds promise in various areas, including logic computing, neural networks, brain-like computing, and integrated technologies combining sensing, storage, and computing. These cutting-edge technologies offer the potential to overcome the performance limitations of traditional architectures, significantly boosting computing power. This discussion explores the physical mechanisms, device structure, performance characteristics, and applications of RRAM devices. Additionally, we delve into the potential future adoption of these technologies at an industrial scale, along with prospects and upcoming research directions.

* Title and MeSH Headings from MEDLINE®/PubMed®, a database of the U.S. National Library of Medicine.