Heel Effect is the well known phenomena in x-ray production. It contributes the effect to image
formation and as well as scattered radiation. But there is paucity in the study related to heel effect.
This study is for mapping and profiling the dose on the surface of water phantom by using mobile
C-arm unit Toshiba SXT-1000A. Based on the result the dose profile is increasing up to at least
about 57% from anode to cathode bound of the irradiated area. This result and information can be
used as a guide to manipulate this phenomenon for better image quality and radiation safety for
this specific and dedicated fluoroscopy unit.